Senior Scientist (MIV/OIS), SIMTech

Role Summary

The Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self-motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X-ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.

The candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X-ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.

Focused areas include, but are not limited to, the following: Novel nano-X-ray inspection technology/system for Semiconductor Manufacturing Science for X-ray interaction with materials and its impact on X-ray 2D imaging and CT reconstruction AI-assisted defects/artefacts detection, classification and prioritization for failure analysis Nano X-ray source with smaller focal-spot, longer lifetime and higher brightness AI-assisted fast X-ray imaging and reconstruction Job Requirements PhD degree in Physics, Material Inspection and Analysis, or other relevant disciplines Candidates with strong publications/patents on high-resolution X-ray imaging, and X-ray and material interaction for semiconductor manufacturing Deep understanding to defects detection, metrology and failure analysis in semiconductor manufacturing Demonstrate strong ability of using scientific software/equipment for defects detection, analysis and simulation Experience on developing X-ray inspection, measurement and analysis solutions for industrial applications, or working with leading R&D institute on X-ray technology development Innovative, self-driven, adaptable, and proactive team player with the ability to work across disciplines